Beijing West District Baiyun Load 10th
Shanghai, 100045
China
Power electronics packaging, NanoCu paste sintering, High-temperature tensile test, Constitutive modeling, Stochastically equivalent finite element, Random void morphology
Power electronics packaging, Nano-copper sintering, Nanoindentation, High-temperature creep, Reliability
4H-SiC MOSFET, SiC/High-𝑘 Gate stack, Hydrogen passivation, Si dangling bond, Interface defect, First-principles calculation