No.219, Ningliu Road
Nanjing, Jiangsu
China
Nanjing University of Science and Technology - School of Material Science and Engineering
Pt, thin film, TCR, High temperature detector, Stability
α-Ga2O3, (AlxGa1-x)2O3 buffer, dislocation, surface roughness
band alignment, epsilon gallium oxide, hexagonal boron carbonitride, Heterojunction
coupling efficiency, effective refractive index, Responsiveness, Multi-segment tapered structure