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Hyeongyeong Bae

Hanyang University

Seoul

Korea, Republic of (South Korea)

  • Hanyang University

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Scholarly Papers (1)

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Interface-Driven Polarization Field Screening in Hf0.5Zr0.5O2/Poly-Si Stacks for 3D Ferroelectric NAND Flash Memory

Number of pages: 22 Posted: 04 Nov 2025
Seonjun Choi, Seungho Bang, Junseo Namgung, Wooyoung Kang, Yu-Jun Jeong, Yeongseo Kim, Hyeongyeong Bae, Chihwan An, Yei Hwan Jung, Seung Chul Chae, Youngji Noh, Wanki Kim, Daewon Ha, Mun Seok Jeong and Yun Heub Song
Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Seoul National University, Hanyang University, Seoul National University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Hanyang University and Hanyang University
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Abstract:

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Ferroelectricity, HZO (Hf0.5Zr0.5O2), NAND Flash, Rapid Thermal Annealing, Polarization Field Screening, Interface Engineering