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Chihwan An

Seoul National University

Kwanak-gu

Seoul, 151-742

Korea, Republic of (South Korea)

  • Seoul National University

SCHOLARLY PAPERS

2

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99

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Scholarly Papers (2)

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1.

Interface-Driven Polarization Field Screening in Hf0.5Zr0.5O2/Poly-Si Stacks for 3D Ferroelectric NAND Flash Memory

Number of pages: 22 Posted: 04 Nov 2025
Seonjun Choi, Seungho Bang, Junseo Namgung, Wooyoung Kang, Yu-Jun Jeong, Yeongseo Kim, Hyeongyeong Bae, Chihwan An, Yei Hwan Jung, Seung Chul Chae, Youngji Noh, Wanki Kim, Daewon Ha, Mun Seok Jeong and Yun Heub Song
Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Seoul National University, Hanyang University, Seoul National University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Hanyang University and Hanyang University
Downloads 53 (1,041,696)

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Ferroelectricity, HZO (Hf0.5Zr0.5O2), NAND Flash, Rapid Thermal Annealing, Polarization Field Screening, Interface Engineering

2.

Thermally Robust HZO/poly-Si Ferroelectric Stacks Enabled by an Ultrathin Ga2O3 Interlayer

Number of pages: 28 Posted: 03 Mar 2026
Junseo Namgung, Seungho Bang, Chihwan An, Seonjun Choi, Wooyoung Kang, Yu-Jun Jeong, Yeongseo Kim, Taewon Hwang, Yei Hwan Jung, Youngji Noh, Wanki Kim, Daewon Ha, Jin-Seong Park, Seung Chul Chae, Mun Seok Jeong and Yun Heub Song
Hanyang University, Hanyang University, Seoul National University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, Hanyang University, affiliation not provided to SSRN, affiliation not provided to SSRN, affiliation not provided to SSRN, Hanyang University, Seoul National University, Hanyang University and Hanyang University
Downloads 46 (1,222,651)

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Ferroelectric HZO (Hf0.5Zr0.5O2), Rapid Thermal Annealing (RTA), Polarization Field Screening, Interface engineering, Gallium Oxide(Ga2O3), Thermal stability