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1-1 Yamadaoka
Suita
Osaka, 565-0871
Japan
The University of Osaka
Direct Cu bonding, sintering, Cu-Ag composite paste, anti-oxidation, SiC electronic packaging, high temperature reliability
Ag hillock, Ag plating, Ag-Cu diffusion, SiC, GaN
Ag-sinter joint, Coating technology, Thermal shock test, Deformation-resistant, Interface evolution.
electroless Cu deposition, Microstructure, nanovoids, hydrogen bubbles, TEM observations